01007nam a2200253 a 4500001001400000003000700014005001700021008004100038020001800079020001500097040000800112245016500120260005700285300003300342490006300375504005000438650004600488650005300534650003300587650004300620700002000663700001700683830005300700vtls000061985KUKTEM20251125093942.0120615t1992    paua   f b    001 0 eng d  a9781558991606  a1558991603  aUMP00aMaterials reliability in microelectronics II :bsymposium held April 27-May 1, 1992, San Francisco, California, U.S.A. /ceditors by C. V. Thompson, J. R. Lloyd  aPittsburgh, PA :bMaterials Research Society,cc1992  aix, 328 p. :bill. ;c24 cm.1 aMaterials Research Society symposium proceedings ;vv. 265  aIncludes bibliographical references and index 0aMicroelectronicsxReliabilityxCongresses 0aMicroelectronicsxMaterialsxTestingxCongresses 0aElectrodiffusionxCongresses 0aMicrostructurexCongressesvCongresses1 aThompson, C. V.1 aLloyd, J. R. 0aMaterials Research Society symposium proceedings