01002nam a2200217 aa4500001001400000003000700014005001700021008004100038020002400079040000800103111010000111245026900211260005900480300002700539490005000566650004000616650003800656700002300694700001700717830005000734vtls000074225KUKTEM20251125095346.0130904t2013    sz a   f      000 0 eng d  a9783037857519 (set)  aUMP2 aInternational Conference on Measurement, Instrumentation and Automationd(2013 : Guilin, China)00aIndustrial instrumentation and control systems II :bselected, peer reviewed papers from the 2013 2nd International Conference on Measurement, Instrumentation and Automation (ICMIA 2013), April 23-24, 2013, Guilin, China /cedited by Prasad Yarlagadda, Yun-Hae Kim  aDurnten-Zurich, Switzerland :bTrans Tech Pub.,cc2013  a3 v. :bill. ;c24 cm.1 aApplied mechanics and materials ;vv. 336-338 0aEngineering instrumentsvCongresses 0aPhysical measurementsvCongresses1 aYarlagadda, Prasad1 aKim, Yun-Hae 0aApplied mechanics and materials ;vv. 336-338