01229nam a2200265 aa4500 vtls000074225 KUKTEM 20251125095346.0 130904t2013 sz a f 000 0 eng d 9783037857519 (set) 201404231600 jamie 201309040850 ida UMP TJ212.2 .M43 2013 International Conference on Measurement, Instrumentation and Automation (2013 : Guilin, China) Industrial instrumentation and control systems II : selected, peer reviewed papers from the 2013 2nd International Conference on Measurement, Instrumentation and Automation (ICMIA 2013), April 23-24, 2013, Guilin, China / edited by Prasad Yarlagadda, Yun-Hae Kim Durnten-Zurich, Switzerland : Trans Tech Pub., c2013 3 v. : ill. ; 24 cm. Applied mechanics and materials ; v. 336-338 Engineering instruments Congresses Physical measurements Congresses Yarlagadda, Prasad Kim, Yun-Hae Applied mechanics and materials ; v. 336-338 0 0 0 0 20000 20000 2019-09-04 1277.44 0 TJ212.2 .M43 2013 0000083800 2019-09-04 00:00:00 1 1277.44 2019-09-04 OPEN v.1 0 0 0 0 20000 20000 2019-09-04 1277.44 0 TJ212.2 .M43 2013 0000083801 2019-09-04 00:00:00 1 1277.44 2019-09-04 OPEN v.2 0 0 0 0 20000 20000 2019-09-04 1277.44 0 TJ212.2 .M43 2013 0000083802 2019-09-04 00:00:00 3 1277.44 2019-09-04 OPEN v.3 VIRTUA40 70610 70616 VTLSSORT0080*0200*0400*0900*1110*2450*2600*3000*4900*6500*6501*7000*7001*8300*9992