Oxide materials for electronic engineering :  fabrication, properties and applications / 
edited by Sergii Ubizskii, Leonid Vasylechko and Yaroslav Zhydachevskii 
 - Durnten-Zurich :  Trans Tech Pub.,  2013 
 - xi, 320 p. :  ill. ;  24 cm. 
 - Diffusion and Defect Data, pt. B : Solid State Phenomena ;  v. 200 .
<br/><br/> Selected, peer reviewed papers from the International Scientific Conference Oxide Materials for Electronic Engineering - Fabrication, Properties and Applications (OMEE 2012), September 3-7, 2012, was held in Lviv, Ukraine 
<br/><br/>Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>9783037856819 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Oxides--Congresses<br/>Electrodes, Oxide--Congresses<br/>Electrical engineering--Congresses