01271nam a2200253 a 4500001001400000003000700014005001700021008004100038020001800079040000800097111015300105245016600258260004500424300003300469490007100502500022600573504005000799650002300849650003400872650003900906700002100945700002300966700002800989vtls000074279KUKTEM20251125095450.0130904t2013    sz a   f      001 0 eng d  a9783037856819  aUMP2 aInternational Scientific Conference Oxide Materials for Electronic Engineering - Fabrication, Properties and Applicationsd(2012 :cLʹviv, Ukraine)10aOxide materials for electronic engineering :bfabrication, properties and applications /cedited by Sergii Ubizskii, Leonid Vasylechko and Yaroslav Zhydachevskii  aDurnten-Zurich :bTrans Tech Pub.,c2013  axi, 320 p. :bill. ;c24 cm.0 aDiffusion and Defect Data, pt. B : Solid State Phenomena ;vv. 200  aSelected, peer reviewed papers from the International Scientific Conference Oxide Materials for Electronic Engineering - Fabrication, Properties and Applications (OMEE 2012), September 3-7, 2012, was held in Lviv, Ukraine  aIncludes bibliographical references and index 0aOxidesvCongresses 0aElectrodes, OxidevCongresses 0aElectrical engineeringvCongresses1 aUbizskii, Sergii1 aVasylechko, Leonid1 aZhydachevskii, Yaroslav