Nonlinear transistor model parameter extraction techniques / 
edited by Matthias Rudolph, Christian Fager, David E. Root 
 - New York :  Cambridge University Press,  2012 
 - xiv, 352 p. :  ill. ;  26 cm. 
 - The Cambridge RF and microwave engineering series .
 - The Cambridge RF and microwave engineering series .
<br/><br/>Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>9780521762106 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Transistors--Mathematical models<br/>Electronic circuit design