Silicon-based millimeter-wave technology measurement, modeling and applications / 
guest editor M. Jamal Deen 
 - Amsterdam :  Elsevier/Academic Press,  2012 
 - xix, 483, [15] p. plates :  ill., col. plates. ;  23 cm. 
 - Advances in imaging and electron physics ;  v. 174 .
 - Advances in imaging and electron physics ;  v . 174 .
<br/><br/>Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>9780123942982 (hbk.) 0123942985 (hbk.) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Millimeter wave devices<br/>Silicon crystals