TY  - BOOK
AU  - Deen,M.Jamal
TI  - Silicon-based millimeter-wave technology measurement, modeling and applications
T2  - Advances in imaging and electron physics
SN  - 9780123942982 (hbk.)
PY  - 2012///
CY  - Amsterdam
PB  - Elsevier/Academic Press
KW  - Millimeter wave devices
KW  - Silicon crystals
N1  - Includes bibliographical references and index
ER  -