Optical manufacturing and testing x :  26-27 August 2013, San Diego, California, United States / 
Oliver W. Fahnie, Ray Williamson, Dae Wook, editors ; sponsored by SPIE 
 - Bellingham, Washington, USA :  SPIE,  [2013] 
 - 1 v. (various pagings) :  ill. ;  28 cm. 
 - Proceedings of SPIE,  volume 8838  0277-786X ; .
<br/><br/>Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>9780819496881 081949688X 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Nanostructured materials