TY  - BOOK
AU  - Fahnie,Oliver W.
AU  - Williamson,Ray
AU  - Wook,Dae
ED  - Optical Manufacturing and Testing X (Conference)
ED  - SPIE (Society)
TI  - Optical manufacturing and testing x: 26-27 August 2013, San Diego, California, United States 
T2  - Proceedings of SPIE,
SN  - 9780819496881
PY  - 2013///]
CY  - Bellingham, Washington, USA
PB  - SPIE
KW  - Nanostructured materials
N1  - Includes bibliographical references and index
ER  -