X-ray diffraction :  structure, principles, and applications / 
Kaimin Shih, editor 
 - Hauppauge, N.Y. :  Nova Science,  2013 
 - ix, 282 p. :  ill. ;  26 cm. 
 - Materials science and technologies .
 - Materials science and technologies .
<br/><br/>Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>9781628085914 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Materials--Microscopy<br/>X-rays--Diffraction<br/>X-ray crystallography<br/>Transmission electron microscopy