TY  - BOOK
AU  - Shih,Kaimin
TI  - X-ray diffraction: structure, principles, and applications 
T2  - Materials science and technologies
SN  - 9781628085914
PY  - 2013///
CY  - Hauppauge, N.Y.
PB  - Nova Science
KW  - Materials
KW  - Microscopy
KW  - X-rays
KW  - Diffraction
KW  - X-ray crystallography
KW  - Transmission electron microscopy
N1  - Includes bibliographical references and index
ER  -