Voigtlander, Bert <br/><br/>
Scanning probe microscopy :  atomic force microscopy and scanning tunneling microscopy 
Bert Voigtlander 
 - New York, NY :  Springer,  2015 
 - xv, 382 p. :  ill. ;  24 cm. 
<br/><br/>Includes bibiliographical references and index 
<br/><br/><label>ISBN: </label>9783662452394 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Scanning probe microscopy<br/>Nanoelectronics