TY  - BOOK
AU  - Voigtlander,Bert
TI  - Scanning probe microscopy: atomic force microscopy and scanning tunneling microscopy
SN  - 9783662452394
PY  - 2015///
CY  - New York, NY
PB  - Springer
KW  - Scanning probe microscopy
KW  - Nanoelectronics
N1  - Includes bibiliographical references and index
ER  -