Nastasi, Michael Anthony,  1950- <br/><br/>
Ion beam analysis :  fundamentals and applications / 
Michael Nastasi, James W. Mayer, Yongqiang Wang 
 - Boca Raton, FL :  CRC Press,  2015 
 - xxi, 450 p. :  ill. ;  24 cm. 
<br/><br/>Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>9781439846384 (hbk.) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Ion bombardment