Testing for small-delay defects in nanoscale CMOS integrated circuits / 
edited by Sandeep K. Goel, Krishnendu Chakrabarty 
 - Boca Raton, FL :  CRC Press,  2014 
 - xv, 247 p. :  ill. ;  24 cm. 
 - Devices, circuits, and systems .
<br/><br/>Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>9781439829417 (hbk.) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Metal oxide semiconductors, Complementary--Testing