TY  - BOOK
AU  - Goel,Sandeep K.
AU  - Chakrabarty,Krishnendu
TI  - Testing for small-delay defects in nanoscale CMOS integrated circuits
T2  - Devices, circuits, and systems
SN  - 9781439829417 (hbk.)
PY  - 2014///
CY  - Boca Raton, FL
PB  - CRC Press
KW  - Metal oxide semiconductors, Complementary
KW  - Testing
N1  - Includes bibliographical references and index
ER  -