Scanning probe microscopy :  physical property characterization at nanoscale / 
edited by Vijay Nalladega 
 - Croatia :  INTECH,  2012 
 - vi, 242 p. :  ill. (some col.) ;  23 cm. 
<br/><br/> Includes bibliographical references 
<br/><br/><label>ISBN: </label>9789535105763 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Scanning probe microscopy