Lee, Myeongkyu <br/><br/>
X-ray diffraction for materials research :  from fundamentals to applications / 
Myeongkyu Lee 
 - Oakville, ON, Canada ;  Waretown, NJ, USA :  Apple Academic Press,  2016 
 - xii, 289 p. :  ill. ;  24 cm. 
<br/><br/>Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>9781771882989 (hbk.) 1771882980 
<br/><br/><label>Subjects--Topical Terms: </label><br/>X-rays--Diffraction<br/>Materials--Research