TY  - BOOK
AU  - Lee,Myeongkyu
TI  - X-ray diffraction for materials research: from fundamentals to applications 
SN  - 9781771882989 (hbk.)
PY  - 2016///
CY  - Oakville, ON, Canada, Waretown, NJ, USA
PB  - Apple Academic Press
KW  - X-rays
KW  - Diffraction
KW  - Materials
KW  - Research
N1  - Includes bibliographical references and index
ER  -