Semiconductor material and device characterization / 
contributors: Wei Du, Feng Zhao, et al. 
 - ix, 200 pages :  illustration ;  31 cm 
<br/><br/>Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>9781788021487 1788021487 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Semiconductors.<br/>Semiconductors--Testing.