TY  - BOOK
AU  - Du, Wei.
AU  - Zhao, Feng.
TI  - Semiconductor material and device characterization
SN  - 9781788021487
PY  - 2017///
CY  - United Kingdom
PB  - Auris Reference Limited
KW  - Semiconductors
KW  - Testing
N1  - Includes bibliographical references and index
ER  -