<?xml version="1.0" encoding="utf-8" ?> <rss version="2.0" xmlns:opensearch="http://a9.com/-/spec/opensearch/1.1/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:atom="http://www.w3.org/2005/Atom"> <channel> <title> <![CDATA[ Search for 'su:&quot;Reliability&quot;']]> </title> <link> https://efind.ump.edu.my/cgi-bin/koha/opac-search.pl?q=ccl=su%3A%22Reliability%22&#38;sort_by=title_dsc&#38;format=rss </link> <atom:link rel="self" type="application/rss+xml" href="https://efind.ump.edu.my/cgi-bin/koha/opac-search.pl?q=ccl=su%3A%22Reliability%22&#38;sort_by=title_dsc&#38;format=rss"/> <description> <![CDATA[ Search results for 'su:&quot;Reliability&quot;' at ]]> </description> <opensearch:totalResults>347</opensearch:totalResults> <opensearch:startIndex>0</opensearch:startIndex> <opensearch:itemsPerPage>30</opensearch:itemsPerPage> <atom:link rel="search" type="application/opensearchdescription+xml" href="https://efind.ump.edu.my/cgi-bin/koha/opac-search.pl?q=ccl=su%3A%22Reliability%22&#38;sort_by=title_dsc&#38;format=opensearchdescription"/> <opensearch:Query role="request" searchTerms="q%3Dccl%3Dsu%253A%2522Reliability%2522" startPage="" /> <item> <title> The workbook of improving maintenance &amp; reliability through cultural change / </title> <dc:identifier>ISBN:0831132760</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=39839</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0831132760.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Thomas, Stephen J..<br /> New York : Industrial Press, 2006 .<br /> 392 p. : , To be used with Improving maintenance &amp; reliability through cultural change (TA169 .T56 2005) 28 cm..<br /> 0831132760 </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=39839">Place hold on <em>The workbook of improving maintenance &amp; reliability through cultural change /</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=39839</guid> </item> <item> <title> Wire bonding in microelectronics / </title> <dc:identifier>ISBN:9780071476232 | 0071476237 | 9780071701013 (hbk.) | 007170101X (hbk.)</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=37594</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0071476237.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Harman, George G..<br /> New York : McGraw-Hill, 2010 .<br /> xx, 426 p. : 24 cm. +.<br /> 9780071476232 | 0071476237 | 9780071701013 (hbk.) | 007170101X (hbk.) </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=37594">Place hold on <em>Wire bonding in microelectronics /</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=37594</guid> </item> <item> <title> The universal generating function in reliability analysis and optimization / </title> <dc:identifier>ISBN:1852339276</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=33490</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1852339276.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Levitin, Gregory.<br /> London : Springer, 2005 .<br /> 442 p. : 25 cm..<br /> 1852339276 </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=33490">Place hold on <em>The universal generating function in reliability analysis and optimization /</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=33490</guid> </item> <item> <title> Uncertainty analysis in engineering and sciences / </title> <dc:identifier>ISBN:9781781545904 (hbk.)</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=77912</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1781545901.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> United Kingdom : Auris Reference, 2015 .<br /> ix,264 p. : 24 cm..<br /> 9781781545904 (hbk.) </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=77912">Place hold on <em>Uncertainty analysis in engineering and sciences /</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=77912</guid> </item> <item> <title> Trustworthy systems through quantitative software engineering / </title> <dc:identifier>ISBN:9780471696919 | 0471696919</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=66120</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0471696919.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Bernstein, Lawrence.<br /> Hoboken, N. J. : Wiley, 2005 .<br /> xxv, 437 p. : 24 cm..<br /> 9780471696919 | 0471696919 </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=66120">Place hold on <em>Trustworthy systems through quantitative software engineering /</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=66120</guid> </item> <item> <title> Trust-based recommendations in multi-layer networks / </title> <dc:identifier>ISBN:9781586038540 | 9783898383165</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=42846</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1586038540.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Heb, Claudia.<br /> Amsterdam : IOS Press , 2008 .<br /> 216 p. : 21 cm..<br /> 9781586038540 | 9783898383165 </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=42846">Place hold on <em>Trust-based recommendations in multi-layer networks /</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=42846</guid> </item> <item> <title> Transportation systems reliability and safety / </title> <dc:identifier>ISBN:9781439846407 (hardback) | 1439846405 (hardback)</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=70798</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1439846405.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Dhillon, B. S..<br /> Boca Raton, FL : CRC Press, 2011 .<br /> xvii, 218 p. : 24 cm..<br /> 9781439846407 (hardback) | 1439846405 (hardback) </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=70798">Place hold on <em>Transportation systems reliability and safety /</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=70798</guid> </item> <item> <title> Transient-induced latchup in CMOS integrated circuits / </title> <dc:identifier>ISBN:9780470824078 | 0470824077</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=58341</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0470824077.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Ker, Ming-Dou..<br /> Singapore ; | Hoboken, NJ : | [Piscataway, NJ] : Wiley ; | IEEE Press, 2009 .<br /> xiii, 249 p. : 26 cm..<br /> 9780470824078 | 0470824077 </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=58341">Place hold on <em>Transient-induced latchup in CMOS integrated circuits /</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=58341</guid> </item> <item> <title> Toward consistent design evaluation of nuclear power piping by nonlinear finite element analysis / </title> <dc:identifier>ISBN:9780791861042</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=83605</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/079186104X.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Zeng, Lingfu.<br /> New York, NY : ASME Press, 2015 .<br /> xvii, 109 p. : 9780791861042 </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=83605">Place hold on <em>Toward consistent design evaluation of nuclear power piping by nonlinear finite element analysis /</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=83605</guid> </item> <item> <title> Time-triggered communication / </title> <dc:identifier>ISBN:9781439846612</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=70243</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1439846618.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> Boca Raton, FL : Taylor &amp; Francis, 2012 .<br /> xxvii, 547 p. : 25 cm..<br /> 9781439846612 </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=70243">Place hold on <em>Time-triggered communication /</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=70243</guid> </item> <item> <title> A three-stage methodology for design evaluation in product development / </title> <dc:identifier>ISBN:THE0005592(Local)</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=5198</link> <description> <![CDATA[ <p> By Faiz Mohd Turan.<br /> Batu Pahat, Johor : UTHM, 2013 .<br /> xix, 198 p. : 30 cm..<br /> THE0005592(Local) </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=5198">Place hold on <em>A three-stage methodology for design evaluation in product development /</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=5198</guid> </item> <item> <title> Systems engineering and safety : building the bridge / </title> <dc:identifier>ISBN:9781466552128 (pbk.)</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=65055</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1466552123.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Glismann, Peter J..<br /> Boca Raton : Taylor &amp; Francis, 2013 .<br /> xviii, 114 pages : 23 cm..<br /> 9781466552128 (pbk.) </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=65055">Place hold on <em>Systems engineering and safety :</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=65055</guid> </item> <item> <title> Systems and software engineering with applications / </title> <dc:identifier>ISBN:9780738158525</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=59568</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0738158526.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Schneidewind, Norman F..<br /> New York, NY : Institute of Electrical and Electronics Engineers, 2009 .<br /> xix, 443 p. : 26 cm..<br /> 9780738158525 </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=59568">Place hold on <em>Systems and software engineering with applications /</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=59568</guid> </item> <item> <title> System software reliability / </title> <dc:identifier>ISBN:1852339500</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=33417</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1852339500.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Pham, Hoang.<br /> London : Springer, 2006 .<br /> 440 p. : 25 cm..<br /> 1852339500 </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=33417">Place hold on <em>System software reliability /</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=33417</guid> </item> <item> <title> System signatures and their applications in engineering reliability / </title> <dc:identifier>ISBN:9780387717968</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=42107</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/038771796X.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Samaniego, Francisco J..<br /> New York : Springer , 2007 .<br /> 149 p. : 24 cm..<br /> 9780387717968 </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=42107">Place hold on <em>System signatures and their applications in engineering reliability /</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=42107</guid> </item> <item> <title> System dependability -- theory and applications : proceedings of the nineteenth International Conference on Dependability of Computer Systems DepCoS-RELCOMEX. July 1-5, 2024, Brunów, Poland / </title> <dc:identifier>ISBN:9783031618574</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=101300</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/3031618572.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> Cham : Springer, 2024 .<br /> 1 online resource , Includes index 9783031618574 </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=101300">Place hold on <em>System dependability -- theory and applications :</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=101300</guid> </item> <item> <title> Successful prediction of product performance : quality, reliability, durability, safety, maintainability, life cycle cost, profit, recalls, other / </title> <dc:identifier>ISBN:9780768083149</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=91389</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0768083141.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Klyatis, Lev M.,.<br /> Warrendale, PA : SAE International, 2016 .<br /> 1 online resource , Perolehan buku elektronik SAE (OTP) - (Pembelian Pukal) 9780768083149 </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=91389">Place hold on <em>Successful prediction of product performance :</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=91389</guid> </item> <item> <title> Structure for dependability : computer-based systems from an interdisciplinary perspective / </title> <dc:identifier>ISBN:1846281105</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=33214</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1846281105.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> New York : Springer, 2006 .<br /> 305 p. : 24 cm..<br /> 1846281105 </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=33214">Place hold on <em>Structure for dependability :</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=33214</guid> </item> <item> <title> Structural reliability analysis and prediction / </title> <dc:identifier>ISBN:9781119265993</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=89914</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1119265991.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Melchers, Robert E.,.<br /> Hoboken, NJ : Wiley, 2018 .<br /> xx, 506 pages : 25 cm..<br /> 9781119265993 </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=89914">Place hold on <em>Structural reliability analysis and prediction /</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=89914</guid> </item> <item> <title> Structural reliability / </title> <dc:identifier>ISBN:9781848210820</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=53514</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1848210825.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Lemaire, Maurice.<br /> United States : Wiley, 2009 .<br /> xx, 488 p. : 24 cm..<br /> 9781848210820 </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=53514">Place hold on <em>Structural reliability /</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=53514</guid> </item> <item> <title> Structural integrity assessment : Proceedings of ICONS 2018 / \ </title> <dc:identifier>ISBN:9789811387678</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=93924</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/9811387672.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> Singapore : Springer Singapore : | Imprint: Springer, 2020 .<br /> 1 online resource 9789811387678 </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=93924">Place hold on <em>Structural integrity assessment :</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=93924</guid> </item> <item> <title> Structural integrity and reliability in electronics : enhancing performance in a lead-free environment / </title> <dc:identifier>ISBN:1402017650</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=32308</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1402017650.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Plumbridge, W. J..<br /> Dordrecht ; | Boston : Kluwer Academic Publishers, 2003 .<br /> xix, 336 p. : 25 cm..<br /> 1402017650 </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=32308">Place hold on <em>Structural integrity and reliability in electronics :</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=32308</guid> </item> <item> <title> Structural dynamics of electronic and photonic systems / </title> <dc:identifier>ISBN:9780470250020</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=61504</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/047025002X.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Suhir, Ephraim.<br /> Hoboken, N.J. : Wiley, 2011 .<br /> x, 598 p. : 25 cm..<br /> 9780470250020 </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=61504">Place hold on <em>Structural dynamics of electronic and photonic systems /</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=61504</guid> </item> <item> <title> Structural dynamics of electronic and photonic systems / </title> <dc:identifier>ISBN:9781781546895 (hbk.)</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=80678</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1781546894.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> United Kingdom : Auris Reference, 2015 .<br /> x, 294 p. : 24 cm..<br /> 9781781546895 (hbk.) </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=80678">Place hold on <em>Structural dynamics of electronic and photonic systems /</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=80678</guid> </item> <item> <title> Structural durability : methods and concepts : enabling cost and mass efficient products / </title> <dc:identifier>ISBN:9783030481735</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=93581</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/3030481735.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Heim, Ruediger..<br /> Cham : Springer International Publishing : | Imprint: Springer, 2020 .<br /> 1 online resource 9783030481735 </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=93581">Place hold on <em>Structural durability : methods and concepts :</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=93581</guid> </item> <item> <title> Stochastic reliability and maintenance modeling : essays in honor of Professor Shunji Osaki on his 70th birthday / </title> <dc:identifier>ISBN:9781447149705</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=67952</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/144714970X.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> New York : Springer, 2013 .<br /> xxii, 360 p. : , ON ORDER 24 cm..<br /> 9781447149705 </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=67952">Place hold on <em>Stochastic reliability and maintenance modeling :</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=67952</guid> </item> <item> <title> Statistical models and methods for reliability and survival analysis / </title> <dc:identifier>ISBN:9781848216198</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=74351</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/184821619X.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> London : | Hoboken, N.J. : ISTE ; | Wiley, 2014 .<br /> xix, 411 p. : 24 cm..<br /> 9781848216198 </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=74351">Place hold on <em>Statistical models and methods for reliability and survival analysis /</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=74351</guid> </item> <item> <title> Spacecraft reliability and multi-state failures ba statistical approach / </title> <dc:identifier>ISBN:9780470687918 (cloth)</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=60409</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0470687916.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Saleh, Joseph H..<br /> Hoboken, N.J. : Wiley, 2011 .<br /> x, 206 p. : 24 cm..<br /> 9780470687918 (cloth) </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=60409">Place hold on <em>Spacecraft reliability and multi-state failures ba statistical approach /</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=60409</guid> </item> <item> <title> Solder joint technology / </title> <dc:identifier>ISBN:9780387388908</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=50116</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0387388907.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Tu, King-Ning.<br /> New York : Springer , 2007 .<br /> xvi, 368 p. : b ill. ; c 25 cm 9780387388908 </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=50116">Place hold on <em>Solder joint technology /</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=50116</guid> </item> <item> <title> Software testing techniques : finding the defects that matter / </title> <dc:identifier>ISBN:1584503467</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=27382</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1584503467.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> Hingham, MA: Charles River Media, 2004 .<br /> xxii, 362 p.: , Includes glossary and index 24 cm..<br /> 1584503467 </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=27382">Place hold on <em>Software testing techniques :</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=27382</guid> </item> </channel> </rss>
