<?xml version="1.0" encoding="utf-8" ?> <rss version="2.0" xmlns:opensearch="http://a9.com/-/spec/opensearch/1.1/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:atom="http://www.w3.org/2005/Atom"> <channel> <title> <![CDATA[ Search for 'su:&quot;Scanning probe microscopy&quot;']]> </title> <link> https://efind.ump.edu.my/cgi-bin/koha/opac-search.pl?q=ccl=su%3A%22Scanning%20probe%20microscopy%22&#38;sort_by=title_dsc&#38;format=rss </link> <atom:link rel="self" type="application/rss+xml" href="https://efind.ump.edu.my/cgi-bin/koha/opac-search.pl?q=ccl=su%3A%22Scanning%20probe%20microscopy%22&#38;sort_by=title_dsc&#38;format=rss"/> <description> <![CDATA[ Search results for 'su:&quot;Scanning probe microscopy&quot;' at ]]> </description> <opensearch:totalResults>8</opensearch:totalResults> <opensearch:startIndex>0</opensearch:startIndex> <opensearch:itemsPerPage>30</opensearch:itemsPerPage> <atom:link rel="search" type="application/opensearchdescription+xml" href="https://efind.ump.edu.my/cgi-bin/koha/opac-search.pl?q=ccl=su%3A%22Scanning%20probe%20microscopy%22&#38;sort_by=title_dsc&#38;format=opensearchdescription"/> <opensearch:Query role="request" searchTerms="q%3Dccl%3Dsu%253A%2522Scanning%2520probe%2520microscopy%2522" startPage="" /> <item> <title> Scanning probe microscopy for energy research / </title> <dc:identifier>ISBN:9789814434706 | 9814434701</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=71194</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/9814434701.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Bonnell, Dawn A..<br /> Hackensack, New Jersey : World Scientific, 2013 .<br /> xvi, 602 p. : 24 cm..<br /> 9789814434706 | 9814434701 </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=71194">Place hold on <em>Scanning probe microscopy for energy research /</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=71194</guid> </item> <item> <title> Scanning probe microscopy : the lab on a tip / </title> <dc:identifier>ISBN:3540431802</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=33316</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/3540431802.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Meyer, E..<br /> Berlin ; | New York : Springer, 2004 .<br /> x, 210 p. : 24 cm..<br /> 3540431802 </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=33316">Place hold on <em>Scanning probe microscopy :</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=33316</guid> </item> <item> <title> Scanning probe microscopy / </title> <dc:identifier>ISBN:9789814324762 | 9814324760</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=67513</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/9814324760.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> Singapore : World Scientific Pub., 2011 .<br /> xiv, 261 p. : 24 cm..<br /> 9789814324762 | 9814324760 </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=67513">Place hold on <em>Scanning probe microscopy /</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=67513</guid> </item> <item> <title> Scanning probe microscopy : atomic force microscopy and scanning tunneling microscopy </title> <dc:identifier>ISBN:9783662452394</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=79676</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/3662452391.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Voigtlander, Bert.<br /> New York, NY : Springer, 2015 .<br /> xv, 382 p. : 24 cm..<br /> 9783662452394 </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=79676">Place hold on <em>Scanning probe microscopy :</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=79676</guid> </item> <item> <title> Scanning probe microscopy : physical property characterization at nanoscale / </title> <dc:identifier>ISBN:9789535105763</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=83489</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/9535105760.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> Croatia : INTECH, 2012 .<br /> vi, 242 p. : , Includes bibliographical references 23 cm..<br /> 9789535105763 </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=83489">Place hold on <em>Scanning probe microscopy :</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=83489</guid> </item> <item> <title> Nanoscale processes on insulating surfaces / </title> <dc:identifier>ISBN:9789812837622 | 9812837620</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=57289</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/9812837620.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Gnecco, Enrico.<br /> Singapore : World Scientific Pub., 2009 .<br /> xiv, 186 p. : 24 cm..<br /> 9789812837622 | 9812837620 </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=57289">Place hold on <em>Nanoscale processes on insulating surfaces /</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=57289</guid> </item> <item> <title> Nanofabrication : fundamentals and applications / </title> <dc:identifier>ISBN:9789812700766 | 9812700765</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=51463</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/9812700765.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> New Jersey : World Scientific , 2008 .<br /> viii, 574 p. : , Includes bibliographical references and index 26 cm..<br /> 9789812700766 | 9812700765 </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=51463">Place hold on <em>Nanofabrication :</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=51463</guid> </item> <item> <title> Applied scanning probe methods II : scanning probe microscopy techniques / </title> <dc:identifier>ISBN:3540262423</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=34964</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/3540262423.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> Berlin ; | London : Springer, 2006 .<br /> xliii, 420 p. : 24 cm..<br /> 3540262423 </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=34964">Place hold on <em>Applied scanning probe methods II :</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=34964</guid> </item> </channel> </rss>
