<?xml version="1.0" encoding="utf-8" ?> <rss version="2.0" xmlns:opensearch="http://a9.com/-/spec/opensearch/1.1/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:atom="http://www.w3.org/2005/Atom"> <channel> <title> <![CDATA[ Search for 'su:&quot;System failures Engineering&quot;']]> </title> <link> https://efind.ump.edu.my/cgi-bin/koha/opac-search.pl?q=ccl=su%3A%22System%20failures%20Engineering%22&#38;sort_by=title_dsc&#38;format=rss </link> <atom:link rel="self" type="application/rss+xml" href="https://efind.ump.edu.my/cgi-bin/koha/opac-search.pl?q=ccl=su%3A%22System%20failures%20Engineering%22&#38;sort_by=title_dsc&#38;format=rss"/> <description> <![CDATA[ Search results for 'su:&quot;System failures Engineering&quot;' at ]]> </description> <opensearch:totalResults>25</opensearch:totalResults> <opensearch:startIndex>0</opensearch:startIndex> <opensearch:itemsPerPage>30</opensearch:itemsPerPage> <atom:link rel="search" type="application/opensearchdescription+xml" href="https://efind.ump.edu.my/cgi-bin/koha/opac-search.pl?q=ccl=su%3A%22System%20failures%20Engineering%22&#38;sort_by=title_dsc&#38;format=opensearchdescription"/> <opensearch:Query role="request" searchTerms="q%3Dccl%3Dsu%253A%2522System%2520failures%2520Engineering%2522" startPage="" /> <item> <title> Verification, validation, and testing of engineered systems / </title> <dc:identifier>ISBN:9780470527511</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=58761</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/047052751X.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Engel, Avner.<br /> Hoboken, N.J. : Wiley, 2010 .<br /> xix, 687 p. : 25 cm..<br /> 9780470527511 </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=58761">Place hold on <em>Verification, validation, and testing of engineered systems /</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=58761</guid> </item> <item> <title> Troubleshooting : a technicians guide / </title> <dc:identifier>ISBN:1556179634</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=42104</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1556179634.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Mostia, William L..<br /> Research Triangle Park, NC : ISA , 2005 .<br /> xiii, 215 p. : , Includes index 26 cm..<br /> 1556179634 </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=42104">Place hold on <em>Troubleshooting :</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=42104</guid> </item> <item> <title> To forgive design : understanding failure / </title> <dc:identifier>ISBN:9780674065840 | 0674065840</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=68794</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0674065840.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Petroski, Henry.<br /> Cambridge, MA : Belknap Press of Harvard University Press, 2012 .<br /> xii, 410 p. : 22 cm..<br /> 9780674065840 | 0674065840 </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=68794">Place hold on <em>To forgive design :</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=68794</guid> </item> <item> <title> Systems engineering and safety : building the bridge / </title> <dc:identifier>ISBN:9781466552128 (pbk.)</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=65055</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1466552123.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Glismann, Peter J..<br /> Boca Raton : Taylor &amp; Francis, 2013 .<br /> xviii, 114 pages : 23 cm..<br /> 9781466552128 (pbk.) </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=65055">Place hold on <em>Systems engineering and safety :</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=65055</guid> </item> <item> <title> Spacecraft reliability and multi-state failures ba statistical approach / </title> <dc:identifier>ISBN:9780470687918 (cloth)</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=60409</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0470687916.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Saleh, Joseph H..<br /> Hoboken, N.J. : Wiley, 2011 .<br /> x, 206 p. : 24 cm..<br /> 9780470687918 (cloth) </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=60409">Place hold on <em>Spacecraft reliability and multi-state failures ba statistical approach /</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=60409</guid> </item> <item> <title> Reliability technology : principles and practice of failure prevention in electronic systems / </title> <dc:identifier>ISBN:9780470749661 | 0470749660</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=59506</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0470749660.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Pascoe, Norman.<br /> Chichester, West Sussex : Wiley, 2011 .<br /> xv, 392 p. : 26 cm..<br /> 9780470749661 | 0470749660 </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=59506">Place hold on <em>Reliability technology :</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=59506</guid> </item> <item> <title> Reliability, stress analysis, and failure prevention issues : presented at ASME International Mechanical Engineering Congress and Exposition, November 5-10 2000, Orlando, Florida / </title> <dc:identifier>ISBN:0791819329</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=26484</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0791819329.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> New York: ASME, 2000 .<br /> v, 133 p.: 28 cm.<br /> 0791819329 </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=26484">Place hold on <em>Reliability, stress analysis, and failure prevention issues :</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=26484</guid> </item> <item> <title> Reliability and failure of electronic materials and devices / </title> <dc:identifier>ISBN:9780120885749 (hbk.)</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=78119</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0120885743.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Ohring, Milton.<br /> London : Academic Press, 2015 .<br /> xxiv, 734 p. : 24 cm..<br /> 9780120885749 (hbk.) </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=78119">Place hold on <em>Reliability and failure of electronic materials and devices /</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=78119</guid> </item> <item> <title> Productivity and reliability-based maintenance management / </title> <dc:identifier>ISBN:9781557535924 (pbk.)</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=78773</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1557535922.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Stephens, Matthew P..<br /> West Lafayette, IN. : Purdue University Press, 2010 .<br /> ix, p. : 24 cm..<br /> 9781557535924 (pbk.) </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=78773">Place hold on <em>Productivity and reliability-based maintenance management /</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=78773</guid> </item> <item> <title> Practical plant failure analysis : a guide to understanding machinery deterioration and improving equipment reliability / </title> <dc:identifier>ISBN:0849333768 | 9780849333767</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=37047</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0849333768.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Sachs, Neville W..<br /> oca Raton, FL : Taylor &amp; Francis , 2007 .<br /> 266 p. : 27 cm..<br /> 0849333768 | 9780849333767 </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=37047">Place hold on <em>Practical plant failure analysis :</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=37047</guid> </item> <item> <title> Practical engineering failure analysis / </title> <dc:identifier>ISBN:0824757424</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=29268</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0824757424.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Tawancy, Hani M..<br /> New York : Marcel Dekker, 2004 .<br /> ix, 595 p. : , Includes bibliographical references and index 24 cm..<br /> 0824757424 </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=29268">Place hold on <em>Practical engineering failure analysis /</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=29268</guid> </item> <item> <title> PEM fuel cell failure mode analysis / </title> <dc:identifier>ISBN:9781439839171 | 1439839174</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=65792</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1439839174.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> Boca Raton, FL : CRC Press, 2012 .<br /> xii, 352 p. : 26 cm..<br /> 9781439839171 | 1439839174 </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=65792">Place hold on <em>PEM fuel cell failure mode analysis /</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=65792</guid> </item> <item> <title> Mathematical models for systems reliability / </title> <dc:identifier>ISBN:9781420080827</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=52666</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1420080822.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Epstein, Benjamin.<br /> Boca Raton : CRC Press , 2008 .<br /> 253 p. : , &quot;A Chapman &amp; Hall book.&quot; 25 cm.<br /> 9781420080827 </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=52666">Place hold on <em>Mathematical models for systems reliability /</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=52666</guid> </item> <item> <title> Machine learning and knowledge discovery for engineering systems health management / </title> <dc:identifier>ISBN:9781439841785 | 1439841780</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=67402</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1439841780.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> Boca Raton, FL : CRC Press, 2012 .<br /> xxxvii, 464 p. : 24 cm..<br /> 9781439841785 | 1439841780 </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=67402">Place hold on <em>Machine learning and knowledge discovery for engineering systems health management /</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=67402</guid> </item> <item> <title> Heat transfer : thermal management of electronics / </title> <dc:identifier>ISBN:9781439814673 (hardcover : alk. paper) | 1439814678 (hardcover : alk. paper)</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=57874</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1439814678.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Shabany, Younes.<br /> Boca Raton : CRC Press, 2010 .<br /> xv, 491 p., [16] p. of plates : 25 cm..<br /> 9781439814673 (hardcover : alk. paper) | 1439814678 (hardcover : alk. paper) </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=57874">Place hold on <em>Heat transfer :</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=57874</guid> </item> <item> <title> Fundamentals of rotating machinery diagnostics / </title> <dc:identifier>ISBN:0971408106</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=33481</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0971408106.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Bently, Donald E..<br /> Minden, Nev. : Bently Pressurized Bearing Press, 2002 .<br /> 726 p. : 25 cm..<br /> 0971408106 </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=33481">Place hold on <em>Fundamentals of rotating machinery diagnostics /</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=33481</guid> </item> <item> <title> The field guide to understanding human error / </title> <dc:identifier>ISBN:9780754648253 (hbk.) | 0754648257 (hbk.) | 0754648265 (pbk.) | 9780754648260 (pbk.)</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=39259</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0754648257.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Dekker, Sidney..<br /> Aldershot, England ; | Burlington, VT : Ashgate, 2006 .<br /> xv, 236 p. : , Rev. ed. of: The field guide to human error investigations / Sidney Dekker 2002. 23 cm..<br /> 9780754648253 (hbk.) | 0754648257 (hbk.) | 0754648265 (pbk.) | 9780754648260 (pbk.) </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=39259">Place hold on <em>The field guide to understanding human error /</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=39259</guid> </item> <item> <title> Failure rate modelling for reliability and risk / </title> <dc:identifier>ISBN:9781848009851 (hbk. : alk. paper) | 1848009852 (hbk. : alk. paper)</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=46167</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1848009852.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Finkelstein, Maxim.<br /> [London] : Springer, 2008 .<br /> xii, 290 p. : 24 cm..<br /> 9781848009851 (hbk. : alk. paper) | 1848009852 (hbk. : alk. paper) </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=46167">Place hold on <em>Failure rate modelling for reliability and risk /</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=46167</guid> </item> <item> <title> Failure Mode Effects Analysis DVO3PUB38 / </title> <dc:identifier>ISBN:MED0000895(Local)</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=10433</link> <description> <![CDATA[ <p> [Dearborn, MI] : | Society of Manufacturing Engineers, 2002 .<br /> 1 digital video disc (DVD) (13min.): , Library internal view only. 12cm..<br /> MED0000895(Local) </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=10433">Place hold on <em>Failure Mode Effects Analysis</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=10433</guid> </item> <item> <title> Failure mapping : a new and powerful tool for improving reliability and maintenance / </title> <dc:identifier>ISBN:9780831133863 (hardcover) | 0831133864 (hardcover)</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=51395</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0831133864.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Daley, Daniel T..<br /> New York : Industrial Press, 2009 .<br /> xiv, 161 p. : 24 cm..<br /> 9780831133863 (hardcover) | 0831133864 (hardcover) </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=51395">Place hold on <em>Failure mapping :</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=51395</guid> </item> <item> <title> Failure analysis : a practical guide for manufacturers of electronic components and systems / </title> <dc:identifier>ISBN:9780470748244 | 0470748249</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=59789</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0470748249.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Bazu, Marius.<br /> Chichester, West Sussex : Wiley, 2011 .<br /> xxii, 317 p. : 26 cm..<br /> 9780470748244 | 0470748249 </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=59789">Place hold on <em>Failure analysis :</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=59789</guid> </item> <item> <title> Fail-operational safety architecture for ADAS/AD systems and a model-driven approach for dependent failure analysis </title> <dc:identifier>ISBN:9783658294229</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=94121</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/3658294221.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Sari, Bülent,.<br /> Wiesbaden : Springer Vieweg, 2020 .<br /> 1 online resource 9783658294229 </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=94121">Place hold on <em>Fail-operational safety architecture for ADAS/AD systems and a model-driven approach for dependent failure analysis</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=94121</guid> </item> <item> <title> Engineering disasters - lessons to be learned / </title> <dc:identifier>ISBN:0791802302</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=24248</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0791802302.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Lawson, Don.<br /> New York : ASME Press , 2005 .<br /> xxii, 399 p. : 24 cm..<br /> 0791802302 </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=24248">Place hold on <em>Engineering disasters - lessons to be learned /</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=24248</guid> </item> <item> <title> Engineering catastrophes : causes and effects of major accidents / </title> <dc:identifier>ISBN:1845690168 (hbk.) (WP) | 9781845690168 (hbk.) (WP) | 0849398789 (hbk.) (CRC)</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=40830</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1845690168.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Lancaster, J. F..<br /> Cambridge : | Boca Raton, FL : Woodhead ; | Published in North America by CRC Press, 2005 .<br /> xvii, 269 p. : , Previous ed.: Cambridge: Abington, 2000. | &quot;CRC Press order number: WP9878&quot;--T.p. verso. 24 cm..<br /> 1845690168 (hbk.) (WP) | 9781845690168 (hbk.) (WP) | 0849398789 (hbk.) (CRC) </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=40830">Place hold on <em>Engineering catastrophes :</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=40830</guid> </item> <item> <title> Design error : a human factors approach / </title> <dc:identifier>ISBN:9781498783675</dc:identifier> <link>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=87485</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1498783678.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Day, Ronald William,.<br /> Boca Raton : CRC Press, Taylor &amp; Francis Group, 2017 .<br /> xix, 92 pages ; 24 cm..<br /> 9781498783675 </p> ]]> <![CDATA[ <p> <a href="https://efind.ump.edu.my/cgi-bin/koha/opac-reserve.pl?biblionumber=87485">Place hold on <em>Design error :</em></a> </p> ]]> </description> <guid>https://efind.ump.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=87485</guid> </item> </channel> </rss>
