| 000 | 01618ngm a2200265 4500 | ||
|---|---|---|---|
| 001 | vtls000081583 | ||
| 003 | KUKTEM | ||
| 005 | 20251117141042.0 | ||
| 008 | 140703t2009 miu33 g s0 vceng | ||
| 020 | _aMED0000534(Local) | ||
| 039 | 9 |
_a201905271148 _bnazri _c201412021043 _diswan _y201407031438 _znadia |
|
| 040 | _aUMP | ||
| 090 | _advd QC39 .N36 2009 | ||
| 245 | 0 | 0 |
_aNanometrology _h[video recording]: _bDVO8PUB12 / _cproduced by Society of Manufacturing Engineers ; producer/director/editor, David Rembiesa ; written by Tihamer T. Toth-Fejel |
| 260 |
_b[Dearborne, Mich.] : _bSociety of Manufacturing Engineers, _cc2009 |
||
| 300 |
_a1 digital video disc (DVD) (33min.): _bcolor ; _c12cm. |
||
| 490 | 1 | _aManufacturing insights | |
| 500 | _aLibrary internal view only. | ||
| 520 | _aLearn detailed information on the two major types of microscopes in use today, which are based on either an energy beam made up of electrons or ions, or a scanning probe with a sharp tip. The energy beam methods may use electrons, such as in an S-E-M (scanning electron microscope), and the T-E-M (transmission electron microscope), or they may use ionized atoms, such as in the F-I-B (focused ion beam). The scanning probes include the S-T-M (scanning tunneling microscopy), and the A-F-M (atomic force microscopy) | ||
| 538 | _aDisc compatible with computer DVD drive and DVD player. | ||
| 650 | 0 |
_aNanostructured materials _xMeasurement |
|
| 650 | 0 |
_aMicroscopy _xMeasurement |
|
| 830 | 0 | _aManufacturing insights | |
| 999 |
_aVIRTUA4 _c10578 _d10584 |
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| 999 | _aVTLSSORT0080*0200*0400*0900*2450*2600*3000*4900*5000*5200*5380*6500*6501*8300*9992 | ||