| 000 | 00828nam a2200217 a 4500 | ||
|---|---|---|---|
| 001 | vtls000003485 | ||
| 003 | KUKTEM | ||
| 005 | 20251117141154.0 | ||
| 008 | 060614t1994 nyua f 001 0 eng d | ||
| 020 | _a0070376026 | ||
| 039 | 9 |
_a201107131651 _bVLOAD _c201012201536 _dida _c201012201534 _dida _c200908141013 _dVLOAD _y200606141113 _zVLOAD |
|
| 040 | _aUMP | ||
| 100 | 1 | _aLenk, John D. | |
| 245 | 1 | 0 |
_aElectronic testing handbook : _bprocedures and techniques / _cJohn D. Lenk |
| 260 |
_aNew York: _bMcGraw-Hill, _c1994 |
||
| 300 |
_a397 p. : _bill. ; _c24 cm. |
||
| 500 | _aIncludes index | ||
| 650 | 0 |
_aElectronic instruments _vHandbooks, manuals, etc. |
|
| 650 | 0 |
_aElectronic apparatus and appliances _xTesting _vHandbooks, manuals, etc. |
|
| 999 |
_aVIRTUA40 _c12343 _d12349 |
||
| 999 | _aVTLSSORT0080*0200*0400*0900*1000*2450*2600*3000*5000*6500*6501*9991 | ||