000			00926nam a2200253 4500
001			vtls000002686
003			KUKTEM
005			20251117142011.0
020			_a0198501897
039		9	_a201107131644 _bVLOAD _c200908141005 _dVLOAD _c200908140938 _dVLOAD _c200908131505 _dVLOAD _y200606141109 _zVLOAD
040			_aUMP
090			_aQD945 .D43 1999
245	0	0	_aDefect and microstructure analysis by diffraction / _c[edited by] Robert L. Snyder, Jaroslav Fiala, Hans J. Bunge
260			_aOxford; New York: _bOxford University Press, _c1999
300			_axxii, 785 p.: _bill.; _c24 cm.
440		0	_aInternational Union of Crystallography monographs on crystallography; 10
504			_aIncludes bibliographical references and index
650	0	0	_aCrystals _xDefects _xAnalysis
650	0	0	_aDiffraction
650	0	0	_aX-ray crystallography
700	1	2	_aSnyder, Robert L.
700	1	2	_aFiala, Jaroslav
700	1	2	_aBunge, Hans J.
999			_c20398 _d20404