| 000 | 00785nam a2200217 a 4500 | ||
|---|---|---|---|
| 001 | vtls000022650 | ||
| 003 | KUKTEM | ||
| 005 | 20251117142023.0 | ||
| 020 | _a9780471716440 | ||
| 039 | 9 |
_a201107131646 _bVLOAD _c200908141008 _dVLOAD _c200908140941 _dVLOAD _c200908131507 _dVLOAD _y200711261434 _zfara |
|
| 040 | _aUMP | ||
| 090 | _aHV8073 F67 2007 | ||
| 245 | 0 | 0 |
_aForensic analysis on the cutting edge : _bnew methods for trace evidence analysis / _cedited by Robert D. Blackledge |
| 260 |
_aHoboken, NJ : _bJohn Wiley & Sons, Inc., _c2007 |
||
| 300 |
_axxv, 446 p. : _bill. ;24 cm. |
||
| 650 | 0 | _aForensic sciences | |
| 650 | 0 | _aCriminal investigation | |
| 700 | 1 | _aBlackledge, Robert D. | |
| 999 |
_aVIRTUA40 _c20787 _d20793 |
||
| 999 | _aVTLSSORT0080*0200*0400*0900*2450*2600*3000*6500*6501*7000*9991 | ||
| 942 | 0 | 0 | _01 |