| 000 | 00955nam a2200277 a 4500 | ||
|---|---|---|---|
| 001 | vtls000004533 | ||
| 003 | KUKTEM | ||
| 005 | 20251117142057.0 | ||
| 008 | 060614t2003 nyua f 001 0 eng d | ||
| 020 | _a0766820718 | ||
| 039 | 9 |
_a201107131700 _bVLOAD _c201106010933 _dFida _c200908141024 _dVLOAD _c200908140957 _dVLOAD _y200606141119 _zVLOAD |
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| 040 | _aUMP | ||
| 090 | _aT50 .D67 2003 | ||
| 100 | 1 | _aDotson, Connie | |
| 245 | 1 | 0 |
_aFundamentals of dimensional metrology / _cConnie Dotson, Roger Harlow, Richard Thompson |
| 250 | _a4th ed. | ||
| 260 |
_aClifton Park, NY : _bDelmar Learning, _c2003 |
||
| 300 |
_axii, 627 p. : _bill. ; _c24 cm. |
||
| 500 | _aIncludes glossary and index | ||
| 650 | 0 | _aMeasuration | |
| 650 | 0 | _aMeasuring instruments | |
| 700 | 1 | _aHarlow, Roger | |
| 700 | 1 | _aThompson, Richard | |
| 999 |
_aVIRTUA40 _c21954 _d21960 |
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