| 000 | 00772nam a2200205 4500 | ||
|---|---|---|---|
| 001 | vtls000005793 | ||
| 003 | KUKTEM | ||
| 005 | 20251117142136.0 | ||
| 020 | _a1586033123 | ||
| 039 | 9 |
_a201107131711 _bVLOAD _c200908141038 _dVLOAD _c200908141010 _dVLOAD _c200908131525 _dVLOAD _y200606141125 _zVLOAD |
|
| 040 | _aUMP | ||
| 090 | _aQA76.76.A95 W36 2003 | ||
| 100 | _aWang, Keshen | ||
| 245 | 0 | 0 |
_aIntelligent condition monitoring and diagnosis systems : _b a computational intelligence approach / _c Kesheng Wang |
| 260 |
_aAmsterdam, The Netherlands: _b IOS Press, _c 2003 |
||
| 300 |
_ax, 122 p.: _b ill.; _c 24 cm. |
||
| 500 | _aIncludes bibliographical references and index | ||
| 650 | 0 | 0 |
_aExpert systems (Computer science) _xIndustrial applications |
| 650 | 0 | 0 |
_aMachinery _xTesting |
| 999 |
_c23268 _d23274 |
||