| 000 | 00884nam a2200253 a 4500 | ||
|---|---|---|---|
| 001 | vtls000007663 | ||
| 003 | KUKTEM | ||
| 005 | 20251117142212.0 | ||
| 008 | 060606t2005 nyua f 001 0 eng d | ||
| 020 | _a0072825383 | ||
| 020 | _a0071246827 | ||
| 020 | _a9780072825381 | ||
| 039 | 9 |
_a201206221113 _basmadi _c201206211114 _dasmadi _c201107131727 _dVLOAD _c200908141057 _dVLOAD _y200606141135 _zVLOAD |
|
| 040 | _aUMP | ||
| 090 | _aQC39 .D86 2005 | ||
| 100 | 1 | _aDunn, Patrick F. | |
| 245 | 1 | 0 |
_aMeasurement and data analysis for engineering and science / _cPatrick F. Dunn |
| 260 |
_aNew York, NY : _bMcGraw Hill , _c2005 |
||
| 300 |
_axix, 540 p. : _bill. ; _c26 cm. |
||
| 500 | _aIncludes index | ||
| 650 | 0 |
_aPhysical measurements _vTextbooks |
|
| 650 | 0 |
_aStatistic _vTextbooks |
|
| 999 |
_aVIRTUA40 _c24461 _d24467 |
||
| 999 | _aVTLSSORT0080*0200*0201*0202*0400*0900*1000*2450*2600*3000*5000*6500*6501*9991 | ||