| 000 | 00898nam a2200253 4500 | ||
|---|---|---|---|
| 001 | vtls000012322 | ||
| 003 | KUKTEM | ||
| 005 | 20251117142401.0 | ||
| 008 | 060606t2004 xxu gr |0 1 0|eng | | ||
| 020 | _a0831132035 | ||
| 039 | 9 |
_a201107131807 _bVLOAD _c200908141149 _dVLOAD _c200908141120 _dVLOAD _c200908131607 _dVLOAD _y200606141200 _zVLOAD |
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| 040 | _aUMP | ||
| 090 | _aHD47.3 .S27 2005 | ||
| 100 | _aSato, Yoshihiko | ||
| 245 | 0 | 0 |
_aValue analysis tear-down : _b a new process for product development and innovation / _c Yoshihiko Sato and J. Jerry Kaufman |
| 260 |
_aNew York: _b Industrial Press, _c 2005 |
||
| 300 |
_ax, 206 p.: _b ill.; _c 24 cm. |
||
| 504 | _aIncludes bibliographical references and index. | ||
| 650 | 0 | 0 | _aValue analysis (Cost control) |
| 650 | 0 | 0 | _aIndustrial productivity |
| 650 | 0 | 0 | _aNew products |
| 650 | 0 | 0 | _aEngineering economy |
| 700 | 1 | 2 | _aKaufman, J. Jerry |
| 999 |
_c28199 _d28205 |
||