| 000 | 00980nam a22002537a 4500 | ||
|---|---|---|---|
| 001 | vtls000020254 | ||
| 003 | KUKTEM | ||
| 005 | 20251117142428.0 | ||
| 008 | 070704t2006 nju 000 0 eng d | ||
| 020 | _a9780470095713 | ||
| 039 | 9 |
_a201107131818 _bVLOAD _c200908141206 _dVLOAD _c200908141137 _dVLOAD _c200908131618 _dVLOAD _y200707041111 _zfarina |
|
| 040 | _aUMP | ||
| 090 | _aQA275 .F85 2006 | ||
| 100 | 1 | _aFuller, Wayne A. | |
| 245 | 1 | 0 |
_aMeasurement error models / _cWayne A. Fuller |
| 260 |
_aHoboken, NJ : _bWiley-Interscience, _cc2006 |
||
| 300 |
_axxiii, 440 p. : _bill. ; _c24 cm. |
||
| 440 | 0 | _aWiley series in probability and mathematical statistics | |
| 504 | _aIncludes bibliographical references (p. 409-432) and index | ||
| 650 | 0 | _aError analysis (Mathematics) | |
| 650 | 0 | _aRegression analysis | |
| 856 | 4 | 2 | _uhttp://www.loc.gov/catdir/toc/fy0708/2007272086.html |
| 999 |
_aVIRTUA40 _c29036 _d29042 |
||
| 999 | _aVTLSSORT0080*0200*0900*1000*2450*2600*3000*4400*5040*6500*6501*8560*9991 | ||