000			00831nam a2200229 a 4500
001			vtls000013941
003			KUKTEM
005			20251117142443.0
008			060606t2004 xxk gr |0 1 0|eng |
020			_a0521453739
039		9	_a201107131824 _bVLOAD _c200908141213 _dVLOAD _c200908141144 _dVLOAD _c200908131623 _dVLOAD _y200606280917 _zVLOAD
040			_aUMP
090			_aQC176.84.S93 _bI33 2004
100	1		_aIchimiya, Ayahiko
245	1	0	_aReflection high-energy electron diffraction / _cAyahiko Ichimiya and Philip I. Cohen
260			_aCambridge : _bCambridge University Press, _c2004
300			_axi, 353 p. : _bill.; _c25 cm.
504			_aIncludes bibliographical references and index
650	0	0	_aReflection high energy electron diffraction
650	0	0	_aThin films _xSurfaces _xAnalysis
700	1	2	_aCohen, Philip I.
999			_c29490 _d29496