| 000 | 00798nam a2200217 a 4500 | ||
|---|---|---|---|
| 001 | vtls000014915 | ||
| 003 | KUKTEM | ||
| 005 | 20251117142457.0 | ||
| 008 | 060804 000 0 eng d | ||
| 020 | _a1846280230 | ||
| 039 | 9 |
_a201107131833 _bVLOAD _c200908141225 _dVLOAD _c200908141156 _dVLOAD _c200908131630 _dVLOAD _y200608041017 _zkam |
|
| 040 | _aUMP | ||
| 090 | _aTK7874.58 .G76 2006 | ||
| 100 | 1 | _aGrout, Ian A. | |
| 245 | 1 | 0 |
_aIntegrated circuit test engineering : _bmodern techniques / _cIan A. Grout |
| 260 |
_aLondon : _bSpringer, _c2006 |
||
| 300 |
_a362 p. : _bill. ; _c24 cm |
||
| 650 | 0 |
_aIntegrated circuits _xVerification |
|
| 856 | 4 | 2 | _ahttp://www.loc.gov/catdir/enhancements/fy0662/2005929631-d.html |
| 999 |
_aVIRTUA40 _c29933 _d29939 |
||
| 999 | _aVTLSSORT0080*0200*0900*1000*2450*2600*3000*6500*8560*9991 | ||