| 000 | 00899nam a2200241 a 4500 | ||
|---|---|---|---|
| 001 | vtls000014714 | ||
| 003 | KUKTEM | ||
| 005 | 20251117144133.0 | ||
| 008 | 060731t e 001 0 eng d | ||
| 020 | _a1402027850 | ||
| 039 | 9 |
_a201107131832 _bVLOAD _c200908141223 _dVLOAD _c200908141154 _dVLOAD _c200908131629 _dVLOAD _y200607310958 _zdilla |
|
| 040 | _aUMP | ||
| 090 | _aTK 7895 .E42 G59 2004 | ||
| 100 | 1 | _aGizopoulos, Dimitris. | |
| 245 | 1 |
_aEmbedded processor-based self-test / _cby Dimitris Gizopoulos, Antonis Paschalis and Yervant Zorian. |
|
| 260 |
_aBoston : _bKluwer Academic Publishers, _c2004. |
||
| 300 |
_a216 p.: _bill.; _c25 cm. |
||
| 440 | _aFrontiers in electronic testing. | ||
| 650 | 0 |
_aElectronic circuits _xTesting. |
|
| 700 | 1 | 2 | _aPaschalis, Antonis. |
| 700 | 1 | 2 | _aZorian, Yervant. |
| 999 |
_aVIRTUA40 _c30107 _d30113 |
||
| 999 | _aVTLSSORT0080*0200*0900*1000*2450*2600*3000*4400*6500*7000*7001*9991 | ||