000 00850nam a2200229 a 4500
001 vtls000016783
003 KUKTEM
005 20251117144227.0
008 061205t nju e 001 0 eng d
020 _a9812565213
039 9 _a201107131850
_bVLOAD
_c200908141245
_dVLOAD
_c200908141218
_dVLOAD
_c200908131642
_dVLOAD
_y200612051131
_zdilla
040 _aUMP
090 _aQC 611.6 .R3 K69 2005
100 1 _aKozlovski Vitali
245 1 _aRadiation defect engineering /
_cKozlovski Vitali, Abrosimova Vera
260 _aHackensack, N.J. :
_bWorld Scientific,
_c2005.
300 _a253 p. :
_bill. ;
_c26 cm.
440 _aSelected topics in electronics and systems v. 37
650 0 _aSemiconductors
_xEffect of radiation on
650 0 _aSemiconductor doping
999 _aVIRTUA40
_c31961
_d31967
999 _aVTLSSORT0080*0200*0900*1000*2450*2600*3000*4400*6500*6501*9991