| 000 | 00895nam a2200229 a 4500 | ||
|---|---|---|---|
| 001 | vtls000017670 | ||
| 003 | KUKTEM | ||
| 005 | 20251117144230.0 | ||
| 008 | 070124 000 0 eng d | ||
| 020 | _aOPE0001026(Local) | ||
| 039 | 9 |
_a201905291213 _brazi _c201107131857 _dVLOAD _c200908141255 _dVLOAD _c200908141228 _dVLOAD _y200701241418 _zfarina |
|
| 040 | _aUMP | ||
| 090 | _aQC702.7.B65 I58 2005 | ||
| 245 | 0 |
_aIntroduction to focused ion beams : _binstrumentation, theory, techniques, and practice / _cedited by Lucille A. Giannuzzi, Fred A. Stevie |
|
| 260 |
_aNew York : _bSpringer, _cc2005 |
||
| 300 |
_axiv, 357 p. : _bill. ; _c25 cm. |
||
| 504 | _aIncludes bibliographical references and index | ||
| 650 | 0 | _aFocused ion beams | |
| 700 | 1 | _aGiannuzzi, Lucille A. | |
| 700 | 1 | _aStevie, Fred A. | |
| 999 |
_aVIRTUA _c32073 _d32079 |
||
| 999 | _aVTLSSORT0080*0200*0400*0900*2450*2600*3000*5040*6500*7000*7001*9992 | ||