000 00988nam a2200253 a 4500
001 vtls000017449
003 KUKTEM
005 20251117144236.0
008 070116 000 0 eng d
020 _a1402075898
039 9 _a201107131856
_bVLOAD
_c200908141253
_dVLOAD
_c200908141225
_dVLOAD
_c200908131647
_dVLOAD
_y200701161538
_zkam
040 _aUMP
090 _aTK7895.E42 F38 2003
245 0 0 _aFault injection techniques and tools for embedded systems reliability evaluation /
_cedited by Alfredo Benso and Paolo Prinetto
260 _aBoston :
_bKluwer Academic Pub.,
_c2003
300 _a241 p. :
_bill. ;
_c25 cm.
440 0 _aFrontiers in electronic testing ;
_v23
650 0 _aEmbedded computer systems
_xTesting
650 0 _aEmbedded computer systems
_xReliability
650 0 _aFault location (Engineering)
700 1 _aBenso, Alfredo
700 1 _aPrinetto, Paolo
999 _aVIRTUA40
_c32269
_d32275
999 _aVTLSSORT0080*0200*0900*2450*2600*3000*4400*6500*6501*6502*7000*7001*9991