000 01106nam a2200277 a 4500
001 vtls000018199
003 KUKTEM
005 20251117144244.0
008 070213t1989 nyua f 000 0 eng d
020 _a0745806279 (Ellis Horwood)
020 _a0470215240 (Halsted Press)
039 9 _a201107131902
_bVLOAD
_c201106010946
_dFida
_c200908141301
_dVLOAD
_c200908141233
_dVLOAD
_y200702131508
_zfarina
040 _aUMP
090 _aTK7874 .J67 1989
100 1 _aJordan, James
245 1 0 _aCorrelation-based measurement systems /
_cJames Jordan, Peter Bishop, Bijan Kiani
260 _aChichester :
_bE. Horwood ;
_aNew York :
_bHalsted Press,
_c1989
300 _a156 p. :
_bill. ;
_c25 cm.
504 _aIncludes bibliographical references and index
650 0 _aIntegrated circuits
_xDesign and construction
650 0 _aMeasuring instruments
_xDesign and construction
650 0 _aCorrelators
_xDesign and construction
700 1 _aBishop, Peter,
_d1949-
700 1 _aKiani, Bijan
999 _aVIRTUA40
_c32550
_d32556
999 _aVTLSSORT0080*0200*0201*0400*0900*1000*2450*2600*3000*5040*6500*6501*6502*7000*7001*9991