| 000 | 00914nam a2200241 a 4500 | ||
|---|---|---|---|
| 001 | vtls000018337 | ||
| 003 | KUKTEM | ||
| 005 | 20251117144256.0 | ||
| 008 | 070223t2004 njua f 000 0 eng d | ||
| 020 | _a047143308X | ||
| 039 | 9 |
_a201207031222 _bFida _c201107131903 _dVLOAD _c200908141303 _dVLOAD _c200908141235 _dVLOAD _y200702231303 _zkam |
|
| 040 | _aUMP | ||
| 090 | _aTK7867.2 .M66 2004 | ||
| 100 | 1 | _aMontrose, Mark I. | |
| 245 | 1 | 0 |
_aTesting for EMC compliance : _bapproaches and techniques / _cMark I. Montrose, Edward M. Nakauchi |
| 260 |
_aHoboken, NJ : _bJohn Wiley, _c2004 |
||
| 300 |
_a460 p. : _bill. ; _c24 cm. |
||
| 650 | 0 | _aElectromagnetic compatibility | |
| 650 | 0 | _aElectromagnetic interference | |
| 700 | 1 | _aNakauchi, Edward M. | |
| 856 | 4 | 2 | _ahttp://www.loc.gov/catdir/toc/wiley041/2003063488.html |
| 999 |
_aVIRTUA40 _c32942 _d32948 |
||
| 999 | _aVTLSSORT0080*0200*0400*0900*1000*2450*2600*3000*6500*6501*7000*8560*9992 | ||