| 000 | 00967nam a2200241 a 4500 | ||
|---|---|---|---|
| 001 | vtls000020097 | ||
| 003 | KUKTEM | ||
| 005 | 20251117144330.0 | ||
| 008 | 070612t2006 caua f 000 0 eng d | ||
| 020 | _a0123705975 | ||
| 039 | 9 |
_a201207031141 _bFida _c201107131917 _dVLOAD _c201105271101 _dFida _c200908141323 _dVLOAD _y200706121422 _ztraining |
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| 040 | _aUMP | ||
| 090 | _aTK7874.75 .V57 2006 | ||
| 245 | 0 | 0 |
_aVLSI test principles and architectures : _bdesign for testability / _cedited by Laung-Tern Wang, Cheng-Wen Wu, Xiaoqing Wen |
| 260 |
_aSan Fransisco, CA : _bMorgan Kaufmann, _c2006 |
||
| 300 |
_a777 p. : _bill. ; _c24 cm. |
||
| 650 | 0 |
_aIntegrated circuits _xVery large scale integration _xTesting |
|
| 650 | 0 |
_aIntegrated circuits _xVery large scale integration _xDesign |
|
| 700 | 1 | _aWang, Laung-Terng | |
| 700 | 1 | _aWu, Cheng-Wen | |
| 700 | 1 | _aWen, Xiaoqing | |
| 999 |
_aVIRTUA40 _c34158 _d34164 |
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| 999 | _aVTLSSORT0080*0200*0400*0900*2450*2600*3000*6500*6501*7000*7001*7002*9992 | ||