| 000 | 01064nam a2200265 a 4500 | ||
|---|---|---|---|
| 001 | vtls000021684 | ||
| 003 | KUKTEM | ||
| 005 | 20251117144353.0 | ||
| 008 | 071009s2006 xxk f 001 0 eng|d | ||
| 020 | _a3540262423 | ||
| 039 | 9 |
_a201107131932 _bVLOAD _c200908141341 _dVLOAD _c200908141313 _dVLOAD _c200908131717 _dVLOAD _y200710091124 _zfarina |
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| 040 | _aUMP | ||
| 090 | _aQH212.S33 2006 | ||
| 245 | 0 | 0 |
_aApplied scanning probe methods II : _bscanning probe microscopy techniques / _cBharat Bhushan, Harald Fuchs (Eds.) |
| 260 |
_aBerlin ; _aLondon : _bSpringer, _cc2006 |
||
| 300 |
_axliii, 420 p. : _bill. ; _c24 cm. |
||
| 440 | 0 | _aNanoscience and technology | |
| 504 | _aIncludes bibliographical references and index | ||
| 650 | 0 | _aScanning probe microscopy | |
| 650 | 0 |
_aScanning probe microscopy _xIndustrial applications |
|
| 650 | 0 |
_aMaterials _xMicroscopy |
|
| 700 | 1 |
_aBhushan, Bharat, _d1949- |
|
| 700 | 1 |
_aFuchs, H. O. _q(Henry Otten), _d1907- |
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| 999 |
_aVIRTUA40 _c34964 _d34970 |
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