| 000 | 00979nam a2200253 a 4500 | ||
|---|---|---|---|
| 001 | vtls000023176 | ||
| 003 | KUKTEM | ||
| 005 | 20251117144437.0 | ||
| 008 | 071227s2005 ne f 001 0 eng|d | ||
| 020 | _a0127518037 | ||
| 039 | 9 |
_a201107131945 _bVLOAD _c200908141357 _dVLOAD _c200908141329 _dVLOAD _c200908131728 _dVLOAD _y200712271631 _zkam |
|
| 040 | _aUMP | ||
| 090 | _aTK7874.58 .W55 2005 | ||
| 100 | 1 | _aWile, Bruce | |
| 245 | 1 | 0 |
_aComprehensive functional verification : _bthe complete industry cycle / _cBruce Wile, John C. Goss, Wolfgang Roesner |
| 260 |
_aAmsterdam : _bElsevier/Morgan Kaufmann, _c2005 |
||
| 300 |
_a676 p. : _bill. ; _c24 cm. |
||
| 650 | 0 |
_aIntegrated circuits _xVerification |
|
| 650 | 0 | _aComputer engineering | |
| 700 | 1 | _aGoss, John C. | |
| 700 | 1 | _aRoesner, Wolfgang | |
| 856 | 4 | 2 | _ahttp://www.loc.gov/catdir/enhancements/fy0627/2005299338-t.html |
| 999 |
_aVIRTUA40 _c36461 _d36467 |
||
| 999 | _aVTLSSORT0080*0200*0400*0900*1000*2450*2600*3000*6500*6501*7000*7001*8560*9991 | ||