| 000 | 00838nam a2200241 a 4500 | ||
|---|---|---|---|
| 001 | vtls000026039 | ||
| 003 | KUKTEM | ||
| 005 | 20251117144520.0 | ||
| 008 | 080401t2002 ii f 001 0 eng d | ||
| 020 | _a9780871707632 | ||
| 039 | 9 |
_a201107132005 _bVLOAD _c201103180818 _dFida _c200908141423 _dVLOAD _c200908141355 _dVLOAD _y200804011620 _zsufarini |
|
| 040 | _aUMP | ||
| 090 | _aTA417.2 .R35 2002 | ||
| 100 | 1 | _aRaj, Baldev | |
| 245 | 1 | 0 |
_aPractical non-destructive testing / _cBaldev Raj, T. Jayakumar, M.Thavasimuthu |
| 250 | _a2nd ed. | ||
| 260 |
_aNew Delhi : _bNarosa Publishing House, _c2002 |
||
| 300 |
_a184 p. : _bill. ; _c25 cm. |
||
| 650 | 0 | _aNon-destructive testing | |
| 700 | 1 | _aJayakumar, T. | |
| 700 | 1 | _aThavasimuthu, M. | |
| 999 |
_aVIRTUA40 _c37881 _d37887 |
||
| 999 | _aVTLSSORT0080*0200*0400*0900*1000*2450*2500*2600*3000*6500*7000*7001*9991 | ||