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005 20251117144543.0
008 080506s2007 nyua bi 001 0 eng d
020 _a0387309284 (hardcover : alk. paper)
020 _a9780387309286 (hardcover : alk. paper)
039 9 _a201107132013
_bVLOAD
_c201008261548
_dFida
_c200908141435
_dVLOAD
_c200908141406
_dVLOAD
_y200805061214
_znorsaini
040 _aUMP
090 _aTK7874 .O77 2008
100 1 _aOrshansky, Michael
245 1 0 _aDesign for manufacturability and statistical design :
_ba constructive approach /
_cMichael Orshansky, Sani R. Nassif, Duane Boning
260 _aNew York ;
_aLondon :
_bSpringer,
_cc2008
300 _axiv, 310 p. :
_bill. ;
_c24 cm.
490 0 _aSeries on integrated circuits and systems
504 _aIncludes bibliographical references and index
650 0 _aElectronic circuit design
_xMethodology
650 0 _aElectronic circuit design
_xStatistical methods
700 1 _aNassif, Sani
_q(Sani Richard)
700 1 _aBoning, Duane S.
856 4 1 _3Table of contents onlY
_uhttp://www.loc.gov/catdir/enhancements/fy0824/2007933405-t.html
999 _aVIRTUA40
_c38648
_d38654
999 _aVTLSSORT0080*0200*0201*0400*0900*1000*2450*2600*3000*4900*5040*6500*6501*7000*7001*8560*9991