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|---|---|---|---|
| 001 | vtls000029658 | ||
| 003 | KUKTEM | ||
| 005 | 20251117144620.0 | ||
| 008 | 080625t2008 nyuda f 001 0 eng d | ||
| 020 | _a9780387764863 | ||
| 039 | 9 |
_a201107132026 _bVLOAD _c200908141452 _dVLOAD _c200908141423 _dVLOAD _c200908131801 _dVLOAD _y200806251157 _znorsaini |
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| 040 | _aUMP | ||
| 090 | _aT175 .T44 2008 | ||
| 100 | 1 | _aTehranipoor, Mohammad | |
| 245 | 1 | 0 |
_aNanometer technology designs : _bhigh-quality delay tests / _cMohammad Tehranipoor, Nisar Ahmed |
| 260 |
_aNew York : _bSpringer , _cc2008 |
||
| 300 |
_axvii, 281 p. : _bill. ; _c24 cm. |
||
| 504 | _aIncludes bibliographical references and index | ||
| 650 | 0 | _aNanotechnology | |
| 700 | 1 | _aAhmed, Nisar | |
| 999 |
_aVIRTUA40 _c39903 _d39909 |
||
| 999 | _aVTLSSORT0080*0200*0400*0900*1000*2450*2600*3000*5040*6500*7000*9991 | ||