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008 081112t2008 enka f b 001 0 eng d
020 _a0521819342 (hbk.)
020 _a9780521819343 (hbk.)
039 9 _a201107132054
_bVLOAD
_c200908141531
_dVLOAD
_c200908141501
_dVLOAD
_c200908132035
_dVLOAD
_y200811121600
_zsaini
040 _aUMP
090 _aTK7871.852 .H65 2007
100 1 _aHolt, D. B.
245 1 0 _aExtended defects in semiconductors :
_belectronic properties, device effects and structures /
_cD.B. Holt, B.G. Yacobi
260 _aCambridge ;
_aNew York :
_bCambridge University Press,
_c2007
300 _axi, 631 p. :
_bill. ;
_c26 cm.
504 _aIncludes bibliographical references and index
650 0 _aSemiconductors
_xDefects
700 1 _aYacobi, B. G.
856 4 1 _3Table of contents only
_uhttp://www.loc.gov/catdir/toc/ecip074/2006037298.html
856 4 2 _3Contributor biographical information
_uhttp://www.loc.gov/catdir/enhancements/fy0803/2006037298-b.html
999 _aVIRTUA40
_c42345
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999 _aVTLSSORT0080*0200*0201*0400*0900*1000*2450*2600*3000*5040*6500*7000*8560*8561*9991