| 000 | 00852nam a2200229 a 4500 | ||
|---|---|---|---|
| 001 | vtls000029526 | ||
| 003 | KUKTEM | ||
| 005 | 20251117145240.0 | ||
| 008 | 080616t2008 nyua f 001 0 eng d | ||
| 020 | _a9780387747460 | ||
| 039 | 9 |
_a201107132056 _bVLOAD _c200908141534 _dVLOAD _c200908141504 _dVLOAD _c200908132037 _dVLOAD _y200806161207 _znorsaini |
|
| 040 | _aUMP | ||
| 090 | _aT174.7 .E44 2008 | ||
| 245 | 0 | 0 |
_aEmerging nanotechnologies : _btest, defect tolerance, and reliability / _c[edited by] Mohammad Tehranipoor |
| 260 |
_aNew York : _bSpringer , _c2008 |
||
| 300 |
_axii, 405 p. : _bill. ; _c25 cm. |
||
| 490 | 0 |
_aFrontiers in electronic testing ; _vv. 37 |
|
| 500 | _aIncludes index | ||
| 650 | 0 | _aNanotechnology | |
| 700 | 1 | _aTehranipoor, Mohammad | |
| 999 |
_aVIRTUA40 _c42359 _d42365 |
||
| 999 | _aVTLSSORT0080*0200*0400*0900*2450*2600*3000*4900*5000*6500*7000*9991 | ||